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NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such uef4017bt.

Exposure to limiting values for extended periods may affect device reliability. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information.

Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Definitions for test circuit: Short data sheet — A short data sheet is dataheet extract from a full data sheet with the same product type number s and title.

This document supersedes and replaces all information supplied prior to the publication hereof. Static characteristics Table 6.

Dynamic characteristics Table 7. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.

Rename the pins throughout to be consistent with rest of HEF family. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. The latest product status information is available on the Internet at URL http: Dynamic power dissipation PD PD can be calculated from the formulas shown.


For more information, please visit: Contact information For more information, please visit: Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage.

HEFBT Datasheet PDF – NXP Semiconductors.

Package SOT74 removed from Section 4. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. IEE logic symbol 6. Revision history Table Functional description Table 3.

All referenced brands, product names, service names and trademarks are the property of their respective owners. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.

Decoded outputs are sequential within each stage and from stage to stage, with no dead time except propagation delay. The content is still under internal review and subject to formal approval, which may result in modifications or additions. Limiting values — Stress above one or more limiting values dwtasheet defined in the Absolute Maximum He4017bt System dataasheet IEC may cause permanent damage to the device.

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Applications — Applications that are ratasheet herein for any of these products are for illustrative purposes only. Limiting values Table 4. Test circuit Table Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Automatic counter code correction is provided by an internal circuit: However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as eatasheet the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.


(PDF) HEF4017BT Datasheet download

Plastic or metal protrusions of 0. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http: Product [short] data sheet Production This document contains the product specification.

Schmitt trigger action makes the clock inputs highly tolerant of datashet rise and fall times. When cascading counters, the Q output, which is LOW while the counter is in states datashert, 6, 7, 8, and 9, can be used to drive the CP0 input of the next counter.

In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.

For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. Measurement points given in Table 9. Ordering information Table 1.

Recommended operating conditions Table 5.